Atomic level analysis of electron emitter surfaces by the scanning atom probe
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Abstract
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Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Diamond and Carbon-based Materials Research · Force Microscopy Techniques and Applications
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References (8)
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5. Nishikawa · Appl. Phys. A · 1998 · 66 · S1110.1007/s003390051090 ↗
6. Nishikawa · J. Vac. Sci. Technol. B · 1998 · 16 · 83610.1116/1.589917 ↗
7. Sellschop · Nucl. Instrum. Meth. · 1980 · 168 · 52910.1016/0029-554X(80)91305-1 ↗
8. Nishimori · Diamond Films Technol. · 1996 · 6 · 301