journal article·1998-09

Comparative SIMS investigations on surface contamination of Pt–Ir alloy treated by different cleaning procedures

D.R Sharma, B.R Chakraborty, M.L Das

Applied Surface Science· Volume 135· Issue 1-4
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques

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References (13)

Show source-provided references
1. Bonhoure · BIPM Proc.-Verb. Com. Int. Poids et Mesures · 1946 · 20 · 171
2. G. Girard, The washing and cleaning of Kilogram Prototype at the BIPM, Sevres, BIPM, 1990.
3. Girard · BIPM Proc.-Verb. Com. Int. Poids et Mesures · 1989 · 57 · 123
4. Kobayashi · Bull. NRLM · 1984 · 33 · 127
5. Quinn · Metrologia · 1986 · 23 · 8710.1088/0026-1394/23/2/002 ↗
6. BIPM Comptes Rendus 15th Conf. Gen. Poids et Mesures, Resolution 3 (1975) 103.
7. Ikeda · Metrologia · 1993 · 30 · 13310.1088/0026-1394/30/3/002 ↗
8. Hashiguchi · Surf. Interf. Anal. · 1993 · 20 · 27610.1002/sia.740200403 ↗
9. Cumpson · Metrologia · 1994 · 31 · 2110.1088/0026-1394/31/1/004 ↗
10. M. Plasa, P. Marcarino, A. Torino, Document CCM/91-12, BIPM (1991).
11. M. Plasa, M. Bergoglio, A. Calcatelli, G.L. Piana, in: Proc. 13th Int. IMEKO TC 3 Conf., Helsinki, 1993 p. 155.
12. Cumpson · Metrologia · 1994 · 31 · 37510.1088/0026-1394/31/5/005 ↗
13. D.R. Sharma, B.R. Chakraborty, M.L. Dass, International Conference on Advances in Metrology and its role in Quality Improvement and Global Trade, New Delhi, Feb. 20–22, (1996).