journal article·1986-08

A SIMS depth profiling study of the hydration layer formed at polycrystalline tin oxide surfaces by atmospheric exposure

David F. Cox, Gar B. Hoflund, William H. Hocking

Applied Surface Science· Volume 26· Issue 2
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Abstract

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OpenAlex topics: Ion-surface interactions and analysis · ZnO doping and properties · Gas Sensing Nanomaterials and Sensors

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References (7)

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1. Cox · Appl. Surface Sci. · 1984 · 20 · 3010.1016/0378-5963(84)90014-X ↗
2. Mitchell · Appl. Surface Sci. · 1985 · 21 · 19910.1016/0378-5963(85)90017-0 ↗
3. Hoflund · Appl. Surface Sci. · 1983 · 14 · 28110.1016/0378-5963(83)90043-0 ↗
4. Hoflund · Thin Solid Films · 1985 · 129 · 13910.1016/0040-6090(85)90102-6 ↗
5. de Frésart · Appl. Surface Sci. · 1982 · 11/12 · 63710.1016/0378-5963(82)90109-X ↗
6. de Frésart · Solid State Commun. · 1981 · 37 · 1310.1016/0038-1098(81)90879-6 ↗
7. Giesekke · Inorg. Chem. · 1967 · 6 · 129410.1021/ic50053a005 ↗