Electrical switching and noise spectrum of Si-SiO2 interface defects generated by hot electrons
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OpenAlex topics: Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis · Advancements in Semiconductor Devices and Circuit Design
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References (6)
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4. Bollu · 1987 · 1519
5. Asenov · Appl. Surface Sci. · 1987 · 30 · 31910.1016/0169-4332(87)90108-5 ↗
6. Stegherr · Solid-State Electron. · 1984 · 27 · 105510.1016/0038-1101(84)90043-1 ↗