Electronic structure of Si/disilicide interfaces
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Abstract
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Research context
OpenAlex topics: Semiconductor materials and interfaces · Surface and Thin Film Phenomena · Semiconductor materials and devices
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References (14)
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1. Tung · Phys. Rev. Letters · 1984 · 52 · 46110.1103/PhysRevLett.52.461 ↗
2. Hauenstein · J. Vacuum Sci. Technol. A · 1986 · 4 · 86010.1116/1.573796 ↗
3. Ospelt · Appl. Phys. Letters · 1988 · 52 · 22710.1063/1.99527 ↗
4. Louie · Phys. Rev. B · 1976 · 13 · 246110.1103/PhysRevB.13.2461 ↗
5. Hamann · Phys. Rev. Letters · 1988 · 60 · 31310.1103/PhysRevLett.60.313 ↗
6. van den Hoek · Phys. Rev. Letters · 1988 · 60 · 174310.1103/PhysRevLett.60.1743 ↗
7. Linearized Band Structure Methods
8. Janak · Phys. Rev. B · 1975 · 12 · 125710.1103/PhysRevB.12.1257 ↗
9. Andersen · Phys. Rev. B · 1986 · 34 · 525310.1103/PhysRevB.34.5253 ↗
10. Lambrecht · Phys. Rev. B · 1987 · 36 · 249310.1103/PhysRevB.36.2493 ↗
11. Fujitani · J. Phys. Soc. Japan · 1988 · 57 · 225310.1143/JPSJ.57.2253 ↗
12. Bisi · Surface Sci. · 1987 · 189 · 28510.1016/S0039-6028(87)80444-2 ↗
13. Mattheiss · Phys. Rev. B · 1988 · 18 · 1062310.1103/PhysRevB.37.10623 ↗
14. Tung · Phys. Rev. Letters · 1983 · 50 · 42910.1103/PhysRevLett.50.429 ↗