journal article·1994-12

Observation of the interface of Ba/Si(100) by MDS and TDS

Shozo Hongo, Kaoru Ojima, Shinichi Taniguchi, Toshio Urano, Toru Kanaji

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OpenAlex topics: Semiconductor materials and interfaces · Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques

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References (9)

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