Determination of the spatial distribution of trace elements in stainless steel by imaging microprobe secondary ion mass spectrometry
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Ion-surface interactions and analysis · Mass Spectrometry Techniques and Applications · Nuclear Physics and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (20)
Show source-provided references
1. Evans · Ann. Rev. Mater. Sci. · 1978 · 8 · 18110.1146/annurev.ms.08.080178.001145 ↗
2. Odom · Appl. Spectrosc. Rev. · 1994 · 29 · 6710.1080/05704929408000898 ↗
3. Davies · Surf. Interf. Anal. · 1989 · 14 · 11510.1002/sia.740140304 ↗
4. Gardella · Anal. Chem. · 1980 · 52 · 22610.1021/ac50052a003 ↗
5. Gardella · Anal. Chem. · 1981 · 53 · 187910.1021/ac00235a037 ↗
6. Briggs · Surf. Interf. Anal. · 1982 · 4 · 10910.1002/sia.740040306 ↗
7. Briggs · Surf. Interf. Anal. · 1982 · 4 · 15110.1002/sia.740040405 ↗
8. Briggs · Surf. Interf. Anal. · 1984 · 6 · 18
9. Briggs · 1983 · 162
10. Blestos · Anal. Chem. · 1985 · 57 · 238410.1021/ac00289a049 ↗
11. Benninghoven · 1987
12. Thompson · Anal. Chem. · 1991 · 63 · 244710.1021/ac00021a012 ↗
13. Brinen · Surf. Interf. Anal. · 1991 · 17 · 25910.1002/sia.740170507 ↗
14. Surface contamination analysis of semiconductors by TOF-SIMS
15. Wells · 1974
16. Levi-setti · Scanning Electron Microsc. · 1985 · 11 · 535
17. Levi-setti · Ultramicroscopy · 1988 · 24 · 9710.1016/0304-3991(88)90304-X ↗
18. FEI Co. Instrument Specification for Model 83-2LI-EVA.
19. Benassayag · Ultramicroscopy · 1985 · 16 · 110.1016/S0304-3991(85)80002-4 ↗
20. Driesel · Ultramicroscopy · 1995 · 57 · 4510.1016/0304-3991(94)00165-J ↗