Investigation of the Si(100)2 × 1/Cu interface by UPS and surface reflectance spectroscopy
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OpenAlex topics: Semiconductor materials and interfaces · Surface and Thin Film Phenomena · Electron and X-Ray Spectroscopy Techniques
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References (10)
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1. Mathiez · Surf. Sci. · 1986 · 168 · 15810.1016/0039-6028(86)90846-0 ↗
2. Cros · J. Appl. Phys. · 1990 · 67 · 332810.1063/1.345369 ↗
3. Kemmann · Surf. Sci. · 1987 · 192 · 1110.1016/S0039-6028(87)81158-5 ↗
4. Hanbücken · Surf. Sci. · 1985 · 162 · 62210.1016/0039-6028(85)90957-4 ↗
5. Ishizaka · J. Electrochem. Soc. · 1986 · 133 · 66610.1149/1.2108651 ↗
6. Rossi · Surf. Sci. Rep. · 1987 · 7 · 110.1016/0167-5729(87)90005-7 ↗
7. Radlik · Surf. Sci. · 1988 · 195 · 19510.1016/0039-6028(88)90791-1 ↗
8. Lynch · 1985
9. Rayne · Phys. Rev. · 1961 · 121 · 45610.1103/PhysRev.121.456 ↗
10. McIntyre · Surf. Sci. · 1971 · 24 · 41710.1016/0039-6028(71)90272-X ↗