journal article·1994-11

Modified relative sensitivity factors for Auger spectra

Ferenc Pavlyak

Applied Surface Science· Volume 81· Issue 3
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and devices · Surface and Thin Film Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (8)

Show source-provided references
1. Tanabe · Surf. Sci. · 1987 · 187 · 44910.1016/S0039-6028(87)80071-7 ↗
2. Peebles · Appl. Surf. Sci. · 1987 · 28 · 39510.1016/0169-4332(87)90139-5 ↗
3. Davis · 1976
4. Ichimura · Surf. Sci. · 1983 · 124 · L4910.1016/0039-6028(83)90791-4 ↗
5. Tokutaka · Surf. Sci. · 1987 · 149 · 34910.1016/0039-6028(85)90068-8 ↗
6. Tanuma · Surf. Interf. Anal. · 1988 · 11 · 57710.1002/sia.740111107 ↗
7. Mrozek · Surf. Interf. Anal. · 1988 · 11 · 49910.1002/sia.740111002 ↗
8. Jablonski · Surf. Interf. Anal. · 1988 · 11 · 62710.1002/sia.740111208 ↗