Measurement of surface defects on thin steel wires by atomic force microscopy
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Abstract
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Metal and Thin Film Mechanics
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References (9)
Show source-provided references
1. Surface metrology10.1088/0957-0233/8/9/002 ↗
2. Measurements of surface defects on optical components10.1088/0957-0233/9/4/008 ↗
3. L.M. Sánchez-Brea, J.A. Gómez Pedrero, P. Siegmann, E. Bernabeu, Clasificación de defectos superficiales en hilos de acero (diámetro: 50-500 micras) por microscopı́a de fuerzas atómicas, 1er Congreso Español de Microscopı́a de Efecto Túnel, de Fuerzas Atómicas y de Técnicas Afines, Barcelona (Spain), 1998.
4. ARIS 3300 Personal Atomic Force Microscope users manual, Burleigh Instruments, New York, USA, 1994.
5. Diffusion of light from rough surfaces10.1080/09500349708232913 ↗
6. F. Perez-Quintian, M.A. Rebollo, N.G. Gaggioli, Proceedings of the 7th European Conference of Non-destructive Testing, Copenhagen, 26–29 May, 1998.
7. L.M. Sánchez-Brea, P. Siegmann, E. Bernabeu, F. Pérez-Quintián, M.A. Rebollo, C.A. Raffo, Medición rugosidad y localización de fallas en hilos metálicos por métodos ópticos, 83a Reunión Nacional de Fı́sica, La Plata, Argentina, 1998.
8. D. Klemens, I. Ständer, Catalogue of Drawing Defects, Edited by Deutsche Gesellschaft für Metallkunde (DGM), DGM Informationsgesellschaft Verlag, ISBN 3-88355-069-8, 1985.
9. G. Dieter, Mechanical Metallurgy, 3rd edn., Mc-Graw Hill, New York, 1986.