journal article·1995-10

Deposition of titanium nitride/tungsten layers for application in vertically integrated circuits technology

G. Ruhl, B. Fröschle, P. Ramm, A. Intemann, W. Pamler

Applied Surface Science· Volume 91· Issue 1-4
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Semiconductor materials and devices · Copper Interconnects and Reliability

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (17)

Show source-provided references
1. E. Bertagnolli and H. Klose, P4400985.2, German Patent.
2. P. Ramm and R. Buchner, P4433846.5, German Patent.
3. Fröschle · 1994 · 342 · 123
4. Fix · Chem. Mater. · 1990 · 2 · 23510.1021/cm00009a010 ↗
5. Littau · Semicond. Int. · 1994 · 183
6. Dubois · J. Electrochem Soc. · 1992 · 139 · 360310.1149/1.2087327 ↗
7. Ruhl · 1993 · 309 · 461
8. Intemann · J. Electrochem. Soc. · 1993 · 140 · 321510.1149/1.2221013 ↗
9. Körner · 1991 · 369
10. Körner · 1994 · 513
11. Blumenthal · 1988 · 47
12. Hsieh · 1992 · 77
13. Chatterjee · J. Electrochem. Soc. · 1990 · 137 · 32810.1149/1.2086413 ↗
14. Chang · Thin Solid Films · 1992 · 208 · 17710.1016/0040-6090(92)90639-S ↗
15. Schmitz · 1988 · 55
16. Clark · Microelectron. Manuf. Testing · 1990
17. Ng · 1992 · 1803 · 345