Miscut angles measurement and precise sample positioning with a four circle diffractometer
Source abstract
Abstract
A method is derived for precise sample positioning with a four circle diffractometer. The sample can be oriented either with respect to a crystallographic plane or with respect to the sample surface with an accuracy of about 0.001°. The miscut angles can be easily deduced with an accuracy of a few 1/1000°.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Surface and Thin Film Phenomena · Crystallography and Radiation Phenomena
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References (22)
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