journal article·1999-04

Bismuth-induced surface structure of Si(100) studied by scanning tunneling microscopy

Masamichi Naitoh, Hiroshi Shimaya, Satoshi Nishigaki, Nobuhiro Oishi, Fumiya Shoji

Applied Surface Science· Volume 142· Issue 1-4
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Abstract

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Research context

OpenAlex topics: Surface and Thin Film Phenomena · Semiconductor materials and interfaces · Force Microscopy Techniques and Applications

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References (10)

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