Microstructure and electrical conductivity of (Y, Sr)CoO 3-δ thin films tuned by the film-growth temperature
Source abstract
Abstract
Epitaxial films composed of (Y,Sr)CoO 3-δ and nano-scale Y 2O 3 columns are successfully grown on (La 0.289Sr 0.712)(Al 0.633Ta 0.356)O 3 (001) substrates at 900 °C. The microstructural and electrical properties of the composite films are investigated and compared with those of the single-phase films prepared at 800 °C. In the composite films oxygen vacancies are detectable, which occur alternately in the stacking CoO 2-δ planes of (Y,Sr)CoO 3-δ . In addition, it is found that a large number of misfit dislocations distribute at the interfaces between the Y 2O 3 columns and the (Y,Sr)CoO 3-δ film matrix. The measured resistivity of the composite films is significantly lower than that of the (Y,Sr)CoO 3-δ single-phase films. Our results indicate that the electrical properties of the perovskite-based cobaltates films can be tuned by changing the microstructure through controlling the film-growth temperature.
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Research context
OpenAlex topics: Magnetic and transport properties of perovskites and related materials · Advancements in Solid Oxide Fuel Cells · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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