Characterization of alloy composition in Ga1-xAlxAs/GaAs structures: comparison of photovoltage, X-ray, SIMS and RHEED techniques

journal article·1991-06

D. Lee, S.J. Barnett, A.D. Pitt, M.R. Houlton, G.W. Smith

Applied Surface Science· Volume 50· Issue 1-4

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OpenAlex topics: Ion-surface interactions and analysis · Semiconductor materials and interfaces · Electron and X-Ray Spectroscopy Techniques

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