Method of formation of super-smooth optical surfaces using GCIB and ANAB processing
Source abstract
Abstract
Abstract Optical glass–ceramic is a promising material for the elements of precision optical systems operating in a wide temperature range. However, conventional methods such as the chemical–mechanical or ion polishing do not allow to form a substrate surface with less than 0.2 nm root mean square roughness. The method of gas cluster ion beam (GCIB) and accelerated neutral atom beam (ANAB) processing of glass–ceramic substrates is proposed to obtain super-smooth optical surfaces. The experimental samples were characterized by atomic force microscopy and X-ray diffractometry. It is shown that the surface is modified with the disappearance of linear defects (scratches) and the roughness parameters are improved. Only residual chaotic relief with the average roughness value (Ra) of 0.2 – 0.3 nm is observed after GCIB treatment. Subsequent ANAB processing allows to decrease the Ra parameter down to 0.15 nm. The improvement of surface characteristics is confirmed by the analysis of PSD-function in the investigated range of spatial frequencies. As a result of this work the method for super-smooth optical substrates fabrication was developed and the characteristics of obtained surfaces were investigated.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Ion-surface interactions and analysis · Diamond and Carbon-based Materials Research · Surface Roughness and Optical Measurements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (22)
Show source-provided references
1. T. Arnold, G. Boehm, R. Fechner, J. Meister, A. Nickel, F. Frost, T. Hunsel, and A. Schindler, Ultra-precision surface finishing by ion beam and plasma jet techniques—status and outlook, Nucl. Instr. Meth. A. 616 (2-3) (2010) 147-156, 616(2-3), 147–156. 10.1016/j.nima.2009.11.013.10.1016/j.nima.2009.11.013 ↗
2. Microscopic morphology evolution during ion beam smoothing of Zerodur® surfaces
3. Design and development of an ultralow optical loss mirror coating for Zerodur substrate10.3807/JOSK.2012.16.1.080 ↗
4. Optimization of finishing process during polishing of Zerodur, European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition
5. Precision finishing and fracture strength of ultra-low thermal expansion glass-ceramics and their sintered bodies for ultra-precision applications10.2493/jjspe.84.255 ↗
6. Chemical Mechanical Polishing on Extremely Low Expansion Glass Ceramic Wafers10.4028/www.scientific.net/MSF.874.389 ↗
7. Cluster ion beam processing: Review of current and prospective applications
8. Surface activation and planarization with gas cluster ion beam for wafer bonding10.1149/07509.0009ecst ↗
9. Gas cluster ion formation under pulsed supply of various working gases10.1134/S106378501511019X ↗
10. Ion-beam polishing of fused silica substrates for imaging soft x-ray and extreme ultraviolet optics10.1364/AO.55.001249 ↗
11. Large area smoothing of surfaces by ion bombardment: fundamentals and applications
12. T. Sasaki, N. Toyoda, I. Yamada, Surface Modification and Activation with Gas Cluster Ion Beam. 21st International Conference on Ion Implantation Technology (IIT). (2016) 10.1109/IIT.2016.7882910.10.1109/IIT.2016.7882910 ↗
13. Surface smoothing mechanism of gas cluster ion beams10.1016/S0168-583X(99)00771-5 ↗
14. Cluster size dependence of sputtering yield by cluster ion beam irradiation10.1016/j.nimb.2005.08.023 ↗
15. Cluster ion sources10.1063/1.1142933 ↗
16. Investigation of accelerated neutral atom beams created from gas cluster ion beams10.1016/j.nimb.2012.11.084 ↗
17. Diagnostic method and apparatus for characterization of a neutral beam and for process control therewith // USA Patent № US 9,117,628 B2, 2015 / Sean R. Kirkpatrick, Littleton, Allen R. Kirkpatrick.
18. Torsten Feigl, Angela Duparré, and Andreas Tünnermann Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayers10.1364/AO.50.00C148 ↗
19. Decomposition of AFM images of ultrasmooth optical surface polished with gas cluster ion beam / A. Ieshkin, D. S. Kireev, V. Chernysh et al. // SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES. — 2019. — Vol. 7. — P. 025016–1–025016–7. 10.1088/2051-672X/ab1f49.10.1088/2051-672X/ab1f49 ↗
20. Influence of local densification on microscopic morphology evolution during ion-beam sputtering of fused-silica surfaces10.1364/AO.53.002487 ↗
21. S. F. Timashev, Flicker-noise spectroscopy as a tool for analysis of fluctuations in physical systems. Noise in Physical Systems and 1/F Fluctuations, pp. 775-778 (2001) 10.1142/9789812811165_0174.10.1142/9789812811165_0174 ↗
22. Visualization of supersmooth surfaces texture by the method of flicker-noise spectroscopy