journal article·1999-04

Electrical characterization of InP epitaxial layers using mobility spectrum technique

J Achard, C Guillot, F Barbarin, M Dugay, E Goumet

Applied Surface Science· Volume 142· Issue 1-4
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and devices · Semiconductor Quantum Structures and Devices · Advancements in Semiconductor Devices and Circuit Design

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