SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ions
Source abstract
Abstract
SIMS depth profiling analysis of Au(Cu)/CdTe/CdS/SnO2 solar cell structures were done. We analyzed these structures in the so-called CsM + mode and found an extremely high yield of Cs2Hn + cluster ions, where Hn is halogen, in comparison with CsHn + ion yield and in comparison with yields of other Cs2M +
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Ion-surface interactions and analysis
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References (9)
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