Band structure investigations of GaN films using modulation spectroscopy

Abstract The paper presents investigation results concerning band structure of gallium nitride and position of intrinsic and associate defect levels. Main optical characteristics (transmission, reflection and luminescence) were measured in both ordinary and λ-modulation mode for epitaxy-grown GaN films, allowing to determine valence band splitting caused by spin–orbital interaction (48 meV) and crystalline field (10 meV). Analysis of photoluminescence spectra made it possible to identify main recombination mechanisms involving donor and acceptor levels formed by intrinsic point defects V N , V ′ Ga , and their associates.