Surface composition deviation of Cu2ZnSnS4 derivative powdered samples
Source abstract
Abstract
Abstract Powdered samples of Cu 2 ZnSnS 4 derivatives prepared through a solid-state route were investigated by both bulk (electron dispersive X-ray spectroscopy) and surface-sensitive (X-ray photoelectron spectroscopy) methods. We observe a deviation in composition between the surface and the bulk for all non-stoichiometric samples (both Cu-poor and Cu-rich). This behavior has already been observed for slightly Cu-poor CZTS thin films and is reminiscent of that of CIGSe compounds.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Copper-based nanomaterials and applications
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