journal article·1995-11

Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

S. Kennou, S. Ladas, E.C. Paloura, J.A. Kalomiros

Applied Surface Science· Volume 90· Issue 3
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Abstract

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Research context

OpenAlex topics: Silicon Carbide Semiconductor Technologies · Semiconductor materials and devices · Diamond and Carbon-based Materials Research

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References (12)

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