Step characterization on vicinal Si surfaces by reflection high-energy electron diffraction at arbitrary azimuths
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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
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References (12)
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2. C. Teichert, Y.H. Phang, L.J. Peticolas, J.C. Bean, M.G. Lagally, in: M.C. Tringides (Ed.), Surface Diffusion: Atomistic and Collective Processes, NATO-ASI Series, Plenum, New York, 1997, p. 297.10.1007/978-1-4899-0262-7_27 ↗
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