Anomalous X-ray reflectivity study of metal oxide thin films

journal article·1998-10

S. Banerjee, Y.J. Park, D.R. Lee, Y.H. Jeong, K.-B. Lee, S.B. Yoon, H.M. Choi, J.-C. Park, J.S. Roh, M.K. Sanyal

Applied Surface Science· Volume 136· Issue 1-2

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Abstract

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OpenAlex topics: Surface and Thin Film Phenomena · Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques

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