XPS depth profiling of powdered materials
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
Show source-provided references
1. Yeh · Atomic Nucl. Data Tables · 1985 · 32 · 15510.1016/0092-640X(85)90016-6 ↗
2. Tougaard · Appl. Surf. Sci. · 1996 · 100/101 · 110.1016/0169-4332(96)00246-2 ↗
3. Shimada · Rev. Sci. Instrum. · 1995 · 66 · 178010.1063/1.1145848 ↗
4. Yoshitake · J. Surf. Anal. · 1996 · 2 · 368
5. Okamoto · J. Catal. · 1988 · 112 · 42710.1016/0021-9517(88)90157-1 ↗
6. Zalm · Surf. Interface Anal. · 1998 · 26 · 35210.1002/(SICI)1096-9918(19980501)26:5<352::AID-SIA378>3.0.CO;2-L ↗
7. Tanuma · Surf. Interface Anal. · 1991 · 17 · 92710.1002/sia.740171305 ↗
8. Shimada · Appl. Surf. Sci. · 1996 · 100/101 · 5610.1016/0169-4332(96)00256-5 ↗
9. Shimada · Catal. Lett. · 1996 · 39 · 12510.1007/BF00813741 ↗