journal article·1997-02

Raman characterization of Bi12SiO20 thin films obtained by pulsed laser deposition

J.C. Alonso, R. Diamant, E. Haro-Poniatowski, M. Fernández-Guasti, G. Muñoz, I. Camarillo, M. Jouanne, J.F. Morhange

Applied Surface Science· Volume 109-110
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OpenAlex topics: Electronic and Structural Properties of Oxides · Semiconductor materials and devices · Ferroelectric and Piezoelectric Materials

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References (10)

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