journal article·1997-06

Dependence of TO and LO mode frequency of thermally grown silicon dioxide films on annealing temperature

K. Ishikawa, Y. Uchiyama, H. Ogawa, S. Fujimura

Applied Surface Science· Volume 117-118
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Abstract

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Research context

OpenAlex topics: Glass properties and applications · Silicon Nanostructures and Photoluminescence · Transition Metal Oxide Nanomaterials

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References (11)

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