journal article·1996-11

Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

S. Dieckhoff, V. Schlett, W. Possart, O.-D. Hennemann, J. Günster, V. Kempter

Applied Surface Science· Volume 103· Issue 3
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OpenAlex topics: Molecular Junctions and Nanostructures · Organic Electronics and Photovoltaics · Electron and X-Ray Spectroscopy Techniques

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