Effects of the presence of native silicon oxide at the Fe/Si interface on the formation of silicides studied by Auger spectroscopy
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Semiconductor materials and interfaces · Silicon and Solar Cell Technologies · Silicon Carbide Semiconductor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (16)
Show source-provided references
1. Constitution of Binary Alloys
2. Christensen · Phys. Rev. B · 1990 · 42 · 714810.1103/PhysRevB.42.7148 ↗
3. Bost · J. Appl. Phys. · 1988 · 64 · 203410.1063/1.341735 ↗
4. Cherief · Appl. Phys. Lett. · 1989 · 55 · 167110.1063/1.102313 ↗
5. Gilles · Phys. Rev. B · 1991 · 41 · 577010.1103/PhysRevB.41.5770 ↗
6. The effect of defects on microelectronic devices
7. De Crescenzi · Phys. Rev. B · 1990 · 42 · 587110.1103/PhysRevB.42.5871 ↗
8. Ufuktepe · Solid State Commun. · 1990 · 76 · 19110.1016/0038-1098(90)90540-R ↗
9. Li · J. Appl. Phys. · 1990 · 68 · 109910.1063/1.346750 ↗
10. Moritz · J. Vac. Sci. Technol. B · 1992 · 10 · 170410.1116/1.586226 ↗
11. Higashi · Appl. Phys. Lett. · 1990 · 56 · 65610.1063/1.102728 ↗
12. Bensalah · Phys. Rev. B · 1991 · 43 · 1444110.1103/PhysRevB.43.14441 ↗
13. Zhu · J. Appl. Phys. · 1986 · 60 · 262910.1063/1.337136 ↗
14. Rizzi · J. Vac. Sci. Technol. A · 1991 · 9 · 91210.1116/1.577340 ↗
15. Lau · Thin Solid Films · 1975 · 25 · 41510.1016/0040-6090(75)90059-0 ↗
16. Mathieu · J. Vac. Sci. Technol. A · 1985 · 3 · 33110.1116/1.573260 ↗