journal article·1999-01

TOF study of pulsed-laser ablation of aluminum nitride for thin film growth

C Chu, P.P Ong, H.F Chen, H.H Teo

Applied Surface Science· Volume 137· Issue 1-4
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OpenAlex topics: Mass Spectrometry Techniques and Applications · Ion-surface interactions and analysis · Semiconductor materials and devices

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References (23)

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