journal article·1995-06

Capacitance-voltage characteristics of Schottky barrier diode in the presence of deep-level impurities and series resistance

P. Chattopadhyay, S. Sanyal

Applied Surface Science· Volume 89· Issue 2
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Abstract

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Research context

OpenAlex topics: Semiconductor materials and interfaces · Integrated Circuits and Semiconductor Failure Analysis · Semiconductor materials and devices

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References (10)

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