Scanning Auger measurements of activated and sputter cleaned Re-coated scandate cathodes
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Research context
OpenAlex topics: Semiconductor materials and devices · Electrostatic Discharge in Electronics · Copper Interconnects and Reliability
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References (3)
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1. G. Gaertner et al., This proceedings, invited paper E1.
2. Yamamoto · Appl. Surf. Sci. · 1984 · 17 · 50410.1016/0378-5963(84)90010-2 ↗
3. Manenschijn · 1992 · 67