A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films

N. Hasegawa; K. Hono; R. Okano; H. Fujimori; T. Sakurai

doi:10.1016/0169-4332(93)90345-c

journal article·1993-04

A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films

N. Hasegawa, K. Hono, R. Okano, H. Fujimori, T. Sakurai

Applied Surface Science· Volume 67· Issue 1-4

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

Nanomaterials

OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Force Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (10)

Show source-provided references

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4. Camus · Coll. Phys. · 1989 · 50 · C8

5. Piller · Acta Met. · 1982 · 30 · 110.1016/0001-6160(82)90038-4 ↗

6. Bhatti · Phil. Mag. B · 1985 · 52 · L6310.1080/13642818508238926 ↗

7. Krakauer · Rev. Sci. Instrum. · 1990 · 61 · 339010.1063/1.1141590 ↗

8. Hono · Appl. Surf. Sci. · 1993 · 67 · 39110.1016/0169-4332(93)90343-A ↗

9. K. Hono, Y. Maeda, N. Hasegawa and T. Sakurai, to be published.

10. Liddle · J. Phys. Coll. · 1988 · 49 · C6