Simultaneous imaging of the In and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Near-Field Optical Microscopy
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (18)
Show source-provided references
1. Schwarz · Phys. Rev. B · 1997 · 56 · 698710.1103/PhysRevB.56.6987 ↗
2. Ohnesorge · Science · 1993 · 260 · 145110.1126/science.260.5113.1451 ↗
3. Fujisawa · Philos. Mag. A · 1996 · 75 · 1327
4. H. Hölscher, W. Raberg, U.D. Schwarz, A. Hasbach, R. Wiesendanger, K. Wandelt, submitted.
5. Howald · Phys. Rev. B · 1995 · 51 · 548410.1103/PhysRevB.51.5484 ↗
6. Sugawara · Jpn. J. Appl. Phys. · 1994 · 33 · 373910.1143/JJAP.33.3739 ↗
7. Gießibl · Science · 1995 · 267 · 6810.1126/science.267.5194.68 ↗
8. Bammerlin · Probe Microscopy · 1997 · 1 · 3
9. Fukui · Phys. Rev. Lett. · 1997 · 79 · 420210.1103/PhysRevLett.79.4202 ↗
10. W. Allers, A. Schwarz, U.D. Schwarz, R. Wiesendanger, Appl. Surf. Sci., this proceedings, submitted.
11. Feenstra · Phys. Rev. Lett. · 1987 · 58 · 119210.1103/PhysRevLett.58.1192 ↗
12. Allers · Rev. Sci. Instrum. · 1998 · 69 · 22110.1063/1.1148499 ↗
13. Nanosensors, Aidlingen, Germany.
14. Albrecht · J. Appl. Phys. · 1991 · 69 · 66810.1063/1.347347 ↗
15. Ohta · Jpn. J. Appl. Phys. · 1995 · 34 · L169210.1143/JJAP.34.L1692 ↗
16. Duke · J. Vac. Sci. Technol. B · 1985 · 3 · 108710.1116/1.583057 ↗
17. B. Engels, Dissertation, KFA Jülich, RWTH Aachen, Germany, 1996.
18. Perez · Phys. Rev. Lett. · 1997 · 78 · 67810.1103/PhysRevLett.78.678 ↗