Cu cluster adhesion enhancement on the modified Dow Cyclotene surface through low energy N2+ beam irradiation at grazing angles
Source abstract
Abstract
Abstract In order to enrich the N content at the outer surface of Dow Cyclotene, a low permittivity polymer, a 3 keV N 2 + beam was used to implant N at various angles. Both in situ XPS analysis of the modified surface and the initial coalescence behavior of Cu clusters deposited by evaporation demonstrated that a lower angle between the beam and the surface led to N enrichment at the surface but not to the extent offered by a N 2 + plasma. The reason for this is discussed.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Copper Interconnects and Reliability · Semiconductor materials and devices · Metal and Thin Film Mechanics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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