journal article·2015-11

Investigation of factors influencing microscopic interactions between the diamond indenter and material surfaces in nano-indentation

Qilong Wei, Xiaoyuan Li, Qiang Yang, Wei Gao

Publisher page

Abstract

Abstract Nano-indentation method was brought forward to replace atomic force microscopy (AFM) in simulating microscopic interactions between abrasive particles and material surfaces during polishing process. And main influencing factors including measuring parameters and material's properties were investigated thoroughly. It was found that contact force between the diamond indenter and a fused silica was about 200 μN, while it was about 470 μN between the indenter and an austenitic steel, and in both cases it did not vary with the maximal indentation force ( F max ) and the corresponding loading rate. While adhesion force between the indenter and surfaces of the two materials did not change with F max when the latter was less than its critical value, while it decreased monotonously with increased F max when the latter was higher than its critical value, with slope −1.8615 for the fused silica and −1.5403 for the austenitic steel, and the critical F max was about 20 mN for the fused silica and about 50 mN for the austenitic steel. According to analysis on elastic and plastic deformation during loading process and elastic recovery during unloading process, it was deduced that there would produce marked elastic recovery force when the unloading rate determined by F max was higher, which counteracted the measured adhesion force to some extent and made it less than its corresponding intrinsic value. And material's elasticity had an additional impact. Then it is better to adopt maximal indentation forces less than critical values of materials, to obtain accurate adhesion forces between the indenter and material surfaces, and to simulate accurately microscopic interactions during polishing process.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Surface Polishing Techniques · Diamond and Carbon-based Materials Research

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (28)

Show source-provided references
1. Contact mechanics of superfinishing10.1115/1.555374 ↗
2. A material removal rate model considering interfacial micro-contact wear behavior for chemical mechanical polishing10.1115/1.1828068 ↗
3. Correlation between contact surface and friction during the optical glass polishing10.1016/j.apsusc.2013.10.008 ↗
4. Modeling of various contact theories for the manipulation of different biological micro/nanoparticles based on AFM10.1007/s11051-013-2156-6 ↗
5. The colloidal probe technique and its application to adhesion force measurements10.1002/1521-4117(200207)19:3<129::AID-PPSC129>3.0.CO;2-G ↗
6. Using the adhesive interaction between atomic force microscopy tips and polymer surfaces to measure the elastic modulus of compliant samples10.1021/la036461q ↗
7. Influence of radioactivity on surface interaction forces10.1016/j.jcis.2010.06.042 ↗
8. Controlling adhesion force by means of nanoscale surface roughness10.1021/la201727t ↗
9. AFM measurements of forces between silica surfaces10.1007/s10971-012-2750-6 ↗
10. Dynamic enhancement in adhesion forces of microparticles on substrates10.1021/la4023757 ↗
11. The influence of instrumental parameters on the adhesion force in a flat-on-flat contact geometry10.1016/j.apsusc.2014.04.118 ↗
12. Role of relative size of asperities and adhering particles on the adhesion force10.1016/j.jcis.2013.07.039 ↗
13. Nano-indentation in FCC metals: experimental study10.1007/s00707-009-0151-x ↗
14. Mechanical behavior of nanoscale Cu/PdSi multilayers10.1016/j.actamat.2013.04.047 ↗
15. Creep effects in nanoindentation of hydrated phases of cement pastes10.1016/j.matchar.2009.04.008 ↗
16. Contact modeling — forces10.1016/S0301-679X(00)00063-3 ↗
17. Assessing micromechanical properties of cells with atomic force microscopy: importance of the contact point10.1007/s10237-006-0046-x ↗
18. Computational analysis of adhesion force in the indentation of cells using atomic force microscopy10.1103/PhysRevE.77.021912 ↗
19. Some geometrical considerations about the influence of topography on the adhesion force as measured by AFM on curved surfaces10.1016/j.apsusc.2004.05.164 ↗
20. Force measurements with the atomic force microscope: technique, interpretation and applications10.1016/j.surfrep.2005.08.003 ↗
21. Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy10.3390/ijms131012773 ↗
22. Adhesion models: from single to multiple asperity contacts10.1016/j.cis.2011.03.004 ↗
23. Characterization of the interaction between AFM tips and surface nanobubbles10.1021/la501484p ↗
24. Defining contact at the atomic scale10.1007/s11249-010-9682-5 ↗
25. Zong · 2007
26. The influence of surface roughness on the adhesion force10.1002/sia.1738 ↗
27. Effects of electrostatic and capillary forces and surface deformation on particle detachment in turbulent flows10.1163/016942410X549906 ↗
28. Adhesion and elasticity in nanoscale indentation10.1063/1.2404981 ↗