Ordering of the Si(553) surface with Pb atoms
Source abstract
Abstract
The crystallographic structure and morphology of the Si(5 5 3) surface covered with Pb atoms are investigated with the reflection high energy electron diffraction (RHEED) technique. A regular distribution of steps over a macroscopic sample area is obtained after the adsorption of more than 1.3 monolayers Pb and subsequent annealing. The details of preparation of the ordered surface together with a diffraction model explaining the observed RHEED patterns are presented. The applied model predicts main diffraction features observed with RHEED and confirms the structural order of the surface. © 2014 Elsevier B.V.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Surface and Thin Film Phenomena · Chemical and Physical Properties of Materials · Semiconductor materials and interfaces
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (16)
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