journal article·2002-05

Real time observation of oxygen chemisorption states on during supersonic oxygen molecular beam irradiation

A. Yoshigoe, Y. Teraoka

Applied Surface Science· Volume 190· Issue 1-4
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Abstract

Abstract Employing Si 2p and O 1s photoemission spectroscopy using monochromated synchrotron radiation and the supersonic molecular beam technique, we have performed real time in situ observations of oxidation states on Si (0 0 1)-2×1 at room temperature. High-resolution Si 2p photoemission spectra, which unambiguously resolve oxide components [Si1+, Si2+, Si3+ and Si4+], were successfully measured requiring only 43 s per spectrum. We found that the Si4+ species gradually increases to reach the oxide thickness of 0.57 nm just after the saturation of Si1+, Si2+ and Si3+ species with a translational energy of 2.9 eV.
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Research context

OpenAlex topics: Semiconductor materials and devices · Electronic and Structural Properties of Oxides · Ga2O3 and related materials

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