journal article·1990-01

RHEED intensity analysis of Li/Si(111) structures

S. Kohmoto, S. Mizuno, A. Ichimiya

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Crystallography and Radiation Phenomena · Advanced Electron Microscopy Techniques and Applications · Nuclear materials and radiation effects

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (10)

Show source-provided references
1. Daimon · Surface Sci. · 1985 · 164 · 32010.1016/0039-6028(85)90715-0 ↗
2. Ichimiya · Surface Sci. · 1987 · 191 · L76510.1016/S0039-6028(87)81036-1 ↗
3. Takayanagi · Surface Sci. · 1985 · 164 · 36710.1016/0039-6028(85)90753-8 ↗
4. Mizuno · Appl. Surface Sci. · 1988 · 33/34 · 3810.1016/0169-4332(88)90285-1 ↗
5. Ichimiya · Surface Sci. · 1987 · 192 · L89310.1016/S0039-6028(87)81122-6 ↗
6. Horio · Surface Sci. · 1983 · 133 · 39310.1016/0039-6028(83)90009-2 ↗
7. Ichimiya · Japan. J. Appl. Phys. · 1983 · 22 · 17610.1143/JJAP.22.176 ↗
8. Ichimiya · Japan. J. Appl. Phys. · 1985 · 24 · 136510.1143/JJAP.24.1365 ↗
9. Doyle · Acta Cryst. A · 1968 · 24 · 39010.1107/S0567739468000756 ↗
10. Ichimiya · Japan. J. Appl. Phys. · 1985 · 24 · 157910.1143/JJAP.24.1579 ↗