Laser-induced surface recrystallization of polycrystalline PbI2 thick films for X-ray detector application
Source abstract
Abstract
Abstract In this work, laser-induced surface recrystallization process was developed to improve the surface properties and device performance of the polycrystalline PbI2 thick films prepared by using close space vapor deposition method. A continuous polycrystalline PbI2 recrystallized layer with a better mechanical strength and reflectivity improved from 2% to 4%–6% was obtained by this recrystallization process for the films with mechanical pretreatment. Other polytypes is absent in the recrystallized layer with the 2H-polytype remaining before and after treatment and obtaining improved electrical and X-ray photoelectric response performance. The pretreatment such as mechanical cutting/polishing and hydrogenation is necessary to lower the non-wetting crystallization behavior during the recrystallization process due to the rough surface state and oxygen contamination.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Advanced Semiconductor Detectors and Materials · Quantum Dots Synthesis And Properties · Luminescence Properties of Advanced Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (23)
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