Microscopy of carbon steels: Combined AFM and EBSD study
Source abstract
Abstract
Abstract Atomic force microscopy (AFM) and electron backscatter diffraction were used to study formation of the low-carbon steel surface relief upon chemical etching with nital. The combination of these techniques allowed quantitative characterization of the iron etch depth dependence on the crystallographic orientation of individual ferrite grains. The obtained results demonstrate high potential of AFM for quantitative metallography.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Surface Polishing Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (9)
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