journal article·2012-01

Study on the nano machining process with a vibrating AFM tip on the polymer surface

Weitao Liu, Yongda Yan, Zhenjiang Hu, Xuesen Zhao, Jiucun Yan, Shen Dong

Applied Surface Science· Volume 258· Issue 7
Publisher page

Abstract

Abstract The polymer has been proved to be nano machined by a vibrating tip in tapping mode of Atomic Force Microscope (AFM). The force between the tip and the surface is an important factor which determines success of the machining process. Controlling this force with high accuracy is the foundation of nanomachining in AFM tapping mode. To achieve a deeper understanding on this process, the tip is modeled as a driving oscillator with damping. Factors affecting the nano machining process are studied. The Hertz elastic contact theory is used to calculate the maximum contact pressure applied by the tip which is employed as a criterion to judge the deformation state of the sample. The simulation results show that: The driven amplitude can be used as a main parameter of controlling the machined depth. Sharper tips and harder cantilevers should be used for successful nanomachining with the vibrating tip. Under the same conditions, a larger tip radius will not only result in the machining error, but also lead to failure of the nanomachining process. The higher driving frequency will lead to a larger tapping force. However it cannot be used as a parameter to control the machined depth because of its narrow variation range. But it is a main error source for the nanomachining process in AFM tapping mode. Moreover, a larger Young's modulus polymer sample will induce a smaller machined depth, a larger maximum contact pressure and a bigger tapping force.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Nanofabrication and Lithography Techniques · Advanced Surface Polishing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (20)

Show source-provided references
1. Device fabrication by scanned probe oxidation10.1126/science.270.5242.1625 ↗
2. Matrix-assisted dip-pen nanolithography and polymer pen lithography10.1002/smll.200901198 ↗
3. Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes10.1103/PhysRevB.79.235421 ↗
4. Micromachining of metal-surfaces by scanning probe microscope10.1116/1.587660 ↗
5. Nanoscale lithography with frequency-modulation atomic force microscopy10.1063/1.3043435 ↗
6. Investigation on AFM-based micro/nano-CNC machining system10.1016/j.ijmachtools.2007.01.008 ↗
7. Top-down nanomechanical machining of three-dimensional nanostructures by atomic force microscopy10.1002/smll.200901947 ↗
8. Nanoscale patterning and deformation of soft matter by scanning probe microscopy10.1016/j.msec.2006.08.004 ↗
9. Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope10.1016/S0043-1648(03)00311-9 ↗
10. Breaking polymer chains by dynamic plowing lithography10.1016/S0032-3861(02)00285-9 ↗
11. Nanografting of alkanethiols by tapping mode atomic force microscopy10.1021/la063385t ↗
12. Comparison between dynamic plowing lithography and nanoindentation methods10.1063/1.1421632 ↗
13. Direct measurement of tapping force with a cantilever deflection force sensor10.1016/j.ultramic.2003.11.007 ↗
14. Deformation: contact time, and phase contrast in tapping mode scanning force microscopy10.1021/la960189l ↗
15. Linearity of amplitude and phase in tapping-mode atomic force microscopy10.1103/PhysRevB.61.1106 ↗
16. Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever10.1088/0957-4484/5/4/003 ↗
17. Linear and nonlinear approaches towards amplitude modulation atomic force microscopy10.1016/j.cap.2010.05.006 ↗
18. Scanning and transmission electron microcopies of single-crystal silicon microworn/machined using atomic force microscopy10.1557/JMR.1997.0421 ↗
19. Exploring the consequences of attractive and repulsive regimes in tapping mode atomic force microscopy of DNA10.1088/0957-4484/15/4/011 ↗
20. Andreas Stemmer tuning the interaction forces in tapping mode atomic force microscopy10.1103/PhysRevB.68.085401 ↗