journal article·2013-11

Ohmic contact to n-type Ge with compositional Ti nitride

H.D. Wu, W. Huang, W.F. Lu, R.F. Tang, C. Li, H.K. Lai, S.Y. Chen, C.L. Xue

Publisher page

Abstract

Abstract Fermi-Level pinning at Ge surface results in high Schottky barrier height (SBH) for nearly all metal/n-Ge contacts. By varying composition of the TiN x , modulation of the SBH was demonstrated for TiN x /n-Ge contact. The effective SBH of the TiN 0.1 /n-Ge Schottky contact was found decreased to 0.45 eV, as compared to the Ti/n-Ge contact SBH which was originally pinned at 0.56 eV. Ohmic contact to n-type Ge was realized by increasing the nitrogen composition to x = 0.8 in TiN x . Dipoles formed by the difference of the Pauling electronegativities for Ge and N at the contact interface is proposed to alleviate the Fermi-Level pinning effect.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Semiconductor materials and interfaces · Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (15)

Show source-provided references
1. Dimoulas · Appl. Phys. Lett. · 2006 · 89 · 25211010.1063/1.2410241 ↗
2. Nishimura · Appl. Phys. Lett. · 2007 · 91 · 12312310.1063/1.2789701 ↗
3. Broqvist · Phys. Rev. B · 2008 · 7810.1103/PhysRevB.78.075203 ↗
4. Mönch · J. Vac. Sci. Technol. B · 1999 · 17 · 186710.1116/1.590839 ↗
5. Roy · IEEE Trans. Electron. Dev. · 2010 · 31 · 107710.1109/LED.2010.2058838 ↗
6. Kobayashi · J. Appl. Phys. · 2009 · 105 · 02370210.1063/1.3065990 ↗
7. Lieten · J. Electrochem. Soc. · 2011 · 158 · H35810.1149/1.3545703 ↗
8. Lieten · Appl. Phys. Lett. · 2008 · 92 · 02210610.1063/1.2831918 ↗
9. Iyota · Appl. Phys. Lett. · 2011 · 98 · 19210810.1063/1.3590711 ↗
10. Wu · IEEE Trans. Electron. Dev. · 2012 · 59 · 132810.1109/TED.2012.2187455 ↗
11. Lu · Thin Solid Films · 1999 · 355/356 · 37410.1016/S0040-6090(99)00454-X ↗
12. Arnell · Vacuum · 1996 · 47 · 42510.1016/0042-207X(95)00241-3 ↗
13. Prieto · J. Vac. Sci. Technol. A · 1995 · 13 · 281910.1116/1.579711 ↗
14. Burrow · J. Vac. Sci. Technol. A · 1986 · 4 · 246310.1116/1.574092 ↗
15. Vitale · IEEE Trans. Electron. Dev. · 2011 · 58 · 41910.1109/TED.2010.2092779 ↗