journal article·1997-02

Amplitude recovery in Fresnel projection microscopy

A.L. Bleloch, A. Howie, E.M. James

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (11)

Show source-provided references
1. Gabor · Nature · 1948 · 161 · 77710.1038/161777a0 ↗
2. Munch · Optik · 1975 · 43 · 79
3. Crewe · Rev. Sci. Instrum. · 1968 · 39 · 57610.1063/1.1683435 ↗
4. Binh · Ultramicroscopy · 1995 · 58 · 30710.1016/0304-3991(95)00047-5 ↗
5. Spence · Ultramicroscopy · 1993 · 52 · 47310.1016/0304-3991(93)90063-4 ↗
6. Fink · Phys. Rev. Lett. · 1990 · 65 · 120410.1103/PhysRevLett.65.1204 ↗
7. Lin · Ultramicroscopy · 1986 · 19 · 17910.1016/0304-3991(86)90204-4 ↗
8. Gerchberg · Nature · 1972 · 240 · 40410.1038/240404a0 ↗
9. Fienup · Appl. Opt. · 1982 · 21 · 275810.1364/AO.21.002758 ↗
10. Hanzen · Adv. Electron. Electron Phys. · 1982 · 59 · 110.1016/S0065-2539(08)60108-0 ↗
11. Electron Holography