Lowering of work function induced by deposition of ultra-thin rubidium fluoride layer on polycrystalline diamond surface
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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Electronic and Structural Properties of Oxides · Semiconductor materials and devices
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References (18)
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1. Devries · Annu. Rev. Mater. Sci. · 1987 · 17 · 16110.1146/annurev.ms.17.080187.001113 ↗
2. Angus · Annu. Rev. Mater. Sci. · 1991 · 21 · 22110.1146/annurev.ms.21.080191.001253 ↗
3. Himpsel · Phys. Rev. B · 1979 · 20 · 62410.1103/PhysRevB.20.624 ↗
4. Pate · Surf. Sci. · 1986 · 165 · 8310.1016/0039-6028(86)90665-5 ↗
5. Nemanich · Physica B · 1993 · 185 · 52810.1016/0921-4526(93)90290-M ↗
6. van der Weide · Phys. Rev. B · 1994 · 49 · 1362910.1103/PhysRevB.49.13629 ↗
7. Fox · Mater. Res. Soc. Proc. · 1996 · 416 · 44910.1557/PROC-416-449 ↗
8. Benndorf · Dia. Relat. Mat. · 1996 · 5 · 78410.1016/0925-9635(95)00434-3 ↗
9. Geis · Appl. Phys. Lett. · 1995 · 67 · 132810.1063/1.114529 ↗
10. K.W. Wong, Y. Wang, S.T. Lee, R.W.M. Kwok, unpublished results.
11. K.W. Wong, Y. Wang, S.T. Lee, R.W.M. Kwok, in preparation.
12. Klauser · Phys. Rev. B · 1991 · 43 · 487910.1103/PhysRevB.43.4879 ↗
13. Stankiewicz · Thin Solid Film · 1996 · 280 · 17810.1016/0040-6090(95)08238-7 ↗
14. Wong · Jpn. J. Appl. Phys. · 1996 · 35 · 544410.1143/JJAP.35.5444 ↗
15. J.E. Huheey, Inorganic Chemistry, Principles of Structure and Reactivity, 3rd edn., Harper & Row, A-31, New York, 1983.
16. Poole · Phys. Rev. B · 1975 · 11 · 517910.1103/PhysRevB.11.5179 ↗
17. Overeijnder · Radiat. Eff. · 1978 · 36 · 6310.1080/00337577808233172 ↗
18. Overeijnder · Radiat. Eff. · 1978 · 38 · 2110.1080/00337577808233204 ↗