Formation of highly textured (111) Bi2O3 films by anodization of electrodeposited bismuth films

Abstract Highly textured bismuth oxide (Bi 2 O 3 ) thin films have been prepared using anodic oxidation of electrodeposited bismuth films onto stainless steel substrates. The Bi 2 O 3 films were uniform and adherent to substrate. The Bi 2 O 3 films were characterized for their structural and electrical properties by means of X-ray diffraction (XRD), electrical resistivity and dielectric measurement techniques. The X-ray diffraction pattern showed that Bi 2 O 3 films are highly textured along (1 1 1) plane. The room temperature electrical resistivity of the Bi 2 O 3 films was 10 5 Ω cm. Dielectric measurement revealed normal oxide behavior with frequency.