Measurement of surface roughness by atomic force microscopy and Rutherford backscattering spectrometry of CdS nanocrystalline films
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: nanoparticles nucleation surface interactions · Surface Roughness and Optical Measurements · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. You · Phys. Rev. Lett. · 1993 · 70 · 290010.1103/PhysRevLett.70.2900 ↗
2. Iwamoto · Phys. Rev. Lett. · 1994 · 72 · 402510.1103/PhysRevLett.72.4025 ↗
3. Mbise · Solid State Commun. · 1996 · 97 · 96510.1016/0038-1098(95)00749-0 ↗
4. L.C. Feldman, J.W. Mayer, Fundamentals of Surface and Thin Film Analysis, North-Holland, New York, 1986.10.1016/S0003-2670(00)82855-X ↗
5. Sahu · J. Mater. Sci. Mater. Electron. · 1995 · 6 · 4310.1007/BF00208133 ↗
6. Sahu · Solar Cells · 1987 · 22 · 16310.1016/0379-6787(87)90041-X ↗
7. K.K. Nanda, S.N. Sarangi, S. Mohanty, S.N. Sahu, Thin Solid Films, in press.