Carbon nanotubes as tips in non-contact SFM
Source abstract
Abstract
Abstract The demand for sharp and stable tips suggests the use of carbon nanotubes as probing tips in scanning force microscopy. Here, we report a comparison of the long-range forces of conventional tips and nanotube tips, topographical images of various surfaces, such as Cu(111), Si(111)7×7 and NaCl(100), as well as images of a bundle of multiwalled nanotubes, which was deposited by severe tip crashing. It is found that the long-range forces of carbon nanotube probing tips are reduced and that they are more resistant to wear than conventional silicon tips
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Carbon Nanotubes in Composites · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (14)
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