Effect of Al on the electrochemical corrosion behaviour of Pb free Sn–8.5 Zn–0.5 Ag–XAl–0.5 Ga solder in 3.5% NaCl solution

Abstract The effect of Al on the electrochemical corrosion behaviour of Pb-free Sn–8.5 Zn–0.5 Ag–XAl–0.5 Ga solder in 3.5% NaCl solution was investigated by using potentiodynamic polarization techniques. The X content in the solder varied from 0.1 to 3 wt.%. Polarization studies revealed that an increase in Al content upto 1.5 wt.% decreased the corrosion current density (Icorr), corrosion rate of the solder and shifted the corrosion potential (Ecorr) towards more noble values. However, higher content of Al, i.e. 3 (wt.%) in the five-element solder enhanced the corrosion rate and resulted in a significant increase in the Ecorr towards more negative values. Passivation behaviour was noticed in all the solders having varying Al content, but the passive film formed at 1.5 wt.% Al was most stable due to its low passivation current density (ip) and low critical current density (icc) value in comparison to the other solders. XPS and Auger depth profile results revealed that the passive film consisted of oxides/hydroxides of Al and Zn formed on the surface of the solder with Sn being formed in the subsequent layer. Considerable aluminium segregation occurred towards the surface principally as Al2O3/Al(OH)3 with increase in Al content to 1.5 wt.% in the five element solder. The formation of Al2O3 seemed to prevent the oxidation of zinc on the surface of the solder.