The transport mechanism of YSZ thin films prepared by MOCVD
Source abstract
Abstract
Abstract The effect of microstructure and substrate on the electrical conductivity of yttria stabilized zirconia film (YSZ), prepared by metal–organic chemical vapor deposition (MOCVD), was investigated by complex impedance analysis. The electrical conductivity of the thin films with columnar structure was controlled by the oxygen ion conduction across the columnar grain boundary. The YSZ thin film deposited on Al 2 O 3 (1 0 2), MgO (1 0 0) and SiO 2 with columnar grains exhibit the electrical response of polycrystalline ceramic specimen. The dependence of activation energy and impedance diagram on substrate is increased according to the mismatch of thermal expansion coefficient between film and substrate.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Advancements in Solid Oxide Fuel Cells · Advanced ceramic materials synthesis · Ferroelectric and Piezoelectric Materials
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References (10)
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