Evaporation of gold thin films on mica: effect of evaporation parameters
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OpenAlex topics: Force Microscopy Techniques and Applications · Molecular Junctions and Nanostructures · Advanced Materials Characterization Techniques
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References (38)
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1. H. Poppa, K. Heinemann and A.G. Elliot, J. Vac. Sci. Technol. 8 (1970) 471.10.1116/1.1314581 ↗
2. C.R. Clemmer and Jr. T.P. Beebe, Scanning Microsc. 6 (1992) 319.
3. R.E. Grim, Applied Clay Mineralogy (McGraw-Hill, New York, 1962) p. 102.
4. H. Poppa and E.H. Lee, Thin Solid Films 32 (1976) 223.10.1016/0040-6090(76)90299-6 ↗
5. R. Koch and H. Poppa, Thin Solid Films 151 (1987) 365.10.1016/0040-6090(87)90135-0 ↗
6. M. Barkai, E. Grünbaum and G. Deutscher, Thin Solid Films 90 (1982) 85.10.1016/0040-6090(82)90077-3 ↗
7. S. Guggenheim, Y.-H. Chang and A.F. Koster van Groos, Am. Mineral. 72 (1987) 537.
8. J.A. DeRose, T. Thundat, L.A. Nagahara and S.M. Lindsay, Surf. Sci. 256 (1991) 102.10.1016/0039-6028(91)91204-B ↗
9. C.A. Widrig, C.A. Alves and M.D. Porter, J. Am. Chem. Soc. 113 (1991) 2805.10.1021/ja00008a001 ↗
10. N. Elbel, H. Behner and H. von Seggern, J. Vac. Sci. Technol. B 13 (1995) 2119.10.1116/1.588086 ↗
11. D.W. Pashley, Adv. Phys. 14 (1965) 327.10.1080/00018736500101071 ↗
12. C.E.D. Chidsey, D.N. Loiacono, T. Sleator and S. Nakahara, Surf. Sci. 200 (1988) 45.10.1016/0039-6028(88)90432-3 ↗
13. R. Emch, J. Nogami, M.M. Dovek, C.A. Lang and C.F. Quate, J. Appl. Phys. 65 (1989) 79.10.1063/1.343379 ↗
14. E.I. Altman and R.J. Colton, Surf. Sci. 279 (1992) 49.10.1016/0039-6028(92)90741-N ↗
15. R. Koch, D. Winau, A. Führmann and K. H. Rieder, Vacuum 43 (1992) 521.10.1016/0042-207X(92)90069-9 ↗
16. L.A. Nagahara, T. Thundat, P.I. Oden, S.M. Lindsay and R.L. Rill, Ultramicroscopy 33 (1990) 107.10.1016/0304-3991(90)90013-C ↗
17. R.L. McCarley and A.J. Bard, J. Phys. Chem. 96 (1992) 7410.10.1021/j100197a051 ↗
18. V.M. Hallmark, S. Chiang, J.F. Rabolt, J.D. Swalen and R.J. Wilson, Phys. Rev. Lett. 59 (1987) 2879.10.1103/PhysRevLett.59.2879 ↗
19. J. Hwang and M.A. Dubson, J. Appl. Phys. 72 (1992) 1852.10.1063/1.351657 ↗
20. X.-Y. Zheng, Y. Ding, L.A. Bottomley, D.P. Allison and R.J Warmack, J. Vac. Sci. Technol. B 13 (1995) 1320.10.1116/1.587846 ↗
21. R. Emch, J. Nogami, M.M. Dovek, C.A. Lang and C.F. Quate, J. Microsc. 152 (1988) 129.10.1111/j.1365-2818.1988.tb01370.x ↗
22. J. Inukai, W. Mizutani, K. Saito, H. Shimizu and Y. Iwasawa, Jap. J. Appl. Phys. 30 (1991) 3496.10.1143/JJAP.30.3496 ↗
23. S. Buchholz, H. Fuchs and J. P. Rabe, J. Vac. Sci. Technol. B 9 (1991) 857.10.1116/1.585527 ↗
24. E. Holland-Moritz, J. Gordon, II, G. Borges and R. Sonnenfeld, Langmuir 7 (1991) 301.10.1021/la00050a017 ↗
25. A. Putnam, B.L. Blackford, M.H. Jericho and M.O. Watanabe, Surf. Sci. 217 (1989) 276.10.1016/0039-6028(89)90549-9 ↗
26. H. Wang, J. Jing, H.T. Chu and P.N. Henriksen, J. Vac. Sci. Technol. B 11 (1993) 2000.10.1116/1.586533 ↗
27. A.A. Baski and H. Fuchs, Surf. Sci. 313 (1994) 275.10.1016/0039-6028(94)90048-5 ↗
28. J. Vancea, G. Reiss, F. Schneider, K. Bauer and H. Hoffmann, Surf. Sci. 218 (1989) 108.10.1016/0039-6028(89)90622-5 ↗
29. K. Reichelt and H.O. Lutz, J. Crystal Growth 10 (1971) 103.10.1016/0022-0248(71)90052-2 ↗
30. Green muscovite mica, Asheville-Schoonmaker Mica Co., P.O. Box 318, Newport News, VA 23607, USA.
31. Ruby muscovite mica, ASTM V-1 quality. Electron Microscopy Sciences product 71850. EMS, 321 Morris Road, Box 251, Fort Washington, PA 19034, USA.
32. Goodfellow Cambridge Limited, Cambridge Science Park, Cambridge, CB4 4DJ, England, UK.
33. Edwards Coating System E306A. Edwards High Vacuum, Manor Royal, West Sussex RH10 2LW, England, UK.
34. Sloan DEKTAK II.
35. Friatec AG, Postfach 710261, D-68222 Mannheim, Germany.
36. H.E.-M. Niemi, K.I. Fallström and J.M. Levlin, Acta Polytechnica Scandinavica (1994) Applied Physics Series No. 194.
37. NanoScope III Multimode AFM/STM. Digital Instruments Inc., 520 East Montecito St., Santa Barbara, CA 93103, USA.
38. J.F. O'Hanlon, A User's Guide to Vacuum Technology (John Wiley and Sons, New York, 1980).